The possibility of controlling the insulator-to-metal transition (IMT) in nano-particle VO2\n(NP-VO2) using the electric field effect in a metal-oxide-VO2 field-effect transistor (MOVFET) at\nroom temperature was investigated for the first time. The IMT induced by current in NP-VO2\nis a function of nano-particle size and was studied first using the conducting atomic force\nmicroscope (cAFM) current-voltage (I-V) measurements. NP-VO2 switching threshold voltage (VT),\nleakage current (Ileakage), and the sub-threshold slope of their conductivity (Sc) were all determined.\nThe cAFM data had a large scatter.However, VT increased as a function of particle height (h)\napproximately as VT(V) = 0.034 h, while I leakage decreased as a function of h approximately as Ileakage\n(A) = 3.4 * 10^-8e^-h/9.1. Thus, an asymptotic leakage current of 34 nA at zero particle size and\na tunneling (carrier) decay constant of..............
Loading....